Company Profile: Wayne J. Levin
Wayne Levin is President of Predictum Inc. a company specializing in SAS® and JMP® application development in a variety of industries including semiconductor, consumer products, pharmaceuticals and automotive. Wayne was certified as an instructor with SAS Institute for JMP® in 1997 conducting dozens of courses in statistical methods every year since. He graduated from the University of Toronto in Industrial Engineering with a Master's degree in Engineering from the University of Waterloo.
Company Profile: Diane Michelson PhD
Di Michelson received her Ph.D. in Statistics from Texas A&M University in 1994. She has worked as a statistician in the semiconductor industry, most recently for SEMATECH, the industry consortium. Her research interests include design of experiments, including split plot designs, statistical process control, measurement systems analysis, and other areas of industrial statistics. She has been a Predictum associate since early 2007.
Company Profile: Philip Brown
Philip Brown has more than 10 years of experience in the semiconductor industry where he has worked in areas of device, test and reliability engineering at Motorola and later developed several engineering applications based on JMP at Intel. He has 6 years experience using JSL and is an expert in the language. He also has experience with other languages including Visual Basic, C# and PHP. Philip holds a B.Sc. degree in electrical engineering and M.Sc. degree in electrical/materials engineering. He also member of Tau Beta Pi and Eta Kappa Nu.
Company Profile: Michael Haslam PhD
Dr. Michael E. Haslam was most recently an Engineering Manager, Member of the Technical Staff and Six Sigma Master Black Belt at National Semiconductor Corporation in Arlington, Texas. Joining National in 1988, Dr. Haslam has held a variety of positions in both R&D and manufacturing. His areas of responsibility have included new process development, quality and yield improvement, process control, process improvement, product improvement, operations management and engineering management. Dr. Haslam has taught extensively in the areas of Engineering Data Analysis, Process Control, Risk Analysis and Six Sigma. Most recently, he has built a wide variety of engineering productivity and data analysis tools using the JMP platform.
Dr. Haslam received his BS, M-Eng and PhD degrees in Electrical Engineering from Rensselaer Polytechnic Institute, concentrating in Solid State Physics and Semiconductor Wafer Processing. He holds several patents in the area of Semiconductor Processing.