Predictum: Learning Tools

Capability Analysis

Capability analysis can be understood with this JMP-based dynamic illustration. Explore a variety of indices by adjusting the target, specifications - 1 and 2-sided, symmetrical / asymmetrical - and process variation. Position the mouse over the indices, sliders and other elements in the illustration to reveal explanatory. Click here for full size.

Concepts taught include:

• Cpk, Cp, Cpu, Cpl
• distance to the nearest specification
• defects, PPM, Yield
• adjustable 1 and 2-sided specifications, symmetrical/asymmetrical
• effects of process location, target and centeredness
• effects of sigma